SMZ1270i Zoom Stereomicroscope

by Nikon

The 1270i offers the highest-in-class zoom ratio of 12.7x (0.63 - 8x). It offers wide viewfield at low magnification, enabling easy confirmation of observation targets, while its cutting-edge optics provide bright and sharp images through the entire viewfield. The SMZ1270i is also equipped with intelligent functions that enable automatic detection of magnification data.

Incredible sharpness throughout a wide magnification range

The SMZ1270i offers the highest-in-class zoom ratio of 12.7x (0.63 - 8x). It offers wide viewfield at low magnification, enabling easy confirmation of observation targets, while its cutting-edge optics provide bright and sharp images through the entire viewfield. The SMZ1270i is also equipped with intelligent functions that enable automatic detection of magnification data.

Wide zoom range

The 1270i offers the highest-in-class zoom ratio of 12.7x (0.63 - 8x). It offers both low-magnification wide viewfield observation of the whole of a 35 mm petri dish* during screening and high-magnification observation of minute cell structures.

Newly developed objectives

The newly developed WF series objectives offer uniformly bright images even at low magnification and wide viewfield observation when used with the SMZ1270i. In addition, a 0.75x objective is now available, expanding the lineup of low magnification objectives.

High-level chromatic aberration correction

Apochromat optics have been adopted for the lenses in the SMZ1270i zoom body to achieve high-level chromatic aberration correction. They provide sharp images without blur or color fringe.

Intelligent function for status readout

In combination with the Camera Control Unit DS-L3 and imaging software NIS-Elements, the SMZ1270i can detect zoom magnification data. In addition, with the Intelligent Nosepiece P-RNI2 attached, data related to the objective in use is also detected. Calibration data is automatically altered, following changes of magnification, to display the appropriate scale and measurement results on the images.

On-axis observation with the nosepiece

The double nosepiece offers easy on-axis imaging, enabling observation of the bottom of holes, accurate simple measurement and extended depth-of-focus (EDF) imaging without distortion.

Ergonomic design

Eyepiece tubes with a range of inclination angles are available for comfortable observation. They offer the optimum eyelevel for each user. In addition, slim-type plain stands and the LED Diascopic Illumination Stand easily facilitate the presentation and removal of specimens.

Expandable with a wide range of accessories

In addition to basic optional accessories, the same high level of accessories used with superior models are also available for these models. These include trinocular tubes and slim-type LED diascopic illumination stands. These allow various microscope configurations to suit numerous routine inspections and a range of research and development applications.

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