The JCM-6000Plus is a high-end, high-performance desktop scanning electron microscope that is intuitively operated by a touch panel control, allowing users of all levels to easily and quickly perform SEM techniques.
Secondary electron image in the High Vacuum mode can bring out clear images of samples that require high magnification image and samples with an uneven surface. Comparing SEI images with BEI images allows for closer examination of the surface structure. The image mode may also be switched to backscattered electron image to examine compositional differences.
The Low Vacuum mode, a standard feature in NeoScope, is designed to increase the pressure in the specimen chamber to neutralize the charges on the sample surface, allowing the operator to observe uncoated nonconductive samples. The Low Vacuum mode is also effective for samples containing a small amount of oil or water and gas-emitting samples that resist coating.
JEOL's renowned image quality can be achieved with the utmost ease. A touch panel system with intuitive GUI will guide the operator through the imaging process with the level of ease equal to a smartphone.
Auto controls include alignment, focus, stigmator, contrast/brightness, and Full Auto. A single touch of Full Auto will initiate the entire imaging process to present an image instantly.
An item touched and selected will turn green. Hard, continued pressing of the buttons for coarse control. Light, intermittent tapping for fine control. These control buttons combines the ease of operation from the touch panel and the familiar feel of the knobs.
The Display image button is used to search a library of images for a specific image. Checking the Display image button after selecting a desired image will present a magnified view of the image for closer examination.
Checking the Low Mag Image will allow the operator to view an image acquired at the lowest magnification immediately after the evacuation sequence was completed. This is a useful feature when examining the positioning of the sample.
Up to 6 magnifications are programmable. Programming frequently used magnifications will increase operating efficiency. One of the buttons can be used to preset the current magnification.
The Search image window allows the operator to select and print image data. The window also allows the operator to restore the photographing conditions (accelerating voltage. filament current, probe current, etc.) for any image.
Checking a desired image and pressing the Output images button in the Search image window will display a preview image. If multiple images are selected, the system will automatically print 3 images per page.
NeoScope can retrieve the imaging conditions of any image that is saved in memory. The system will retrieve the data when an image is selected and the Load observation conditions button is pressed. It is a convenient feature for routine operation.
NeoScope can simultaneously display live and retrieved images. In the example below, a low magnification image is presented on the right while a magnified live image on the left. This allows the operator to compare a current image with another image retrieved from memory.
NeoScope incorporates a feature to measure the distance between 2 points. The measured results can be saved within image and also to a CSV data file.
Pressing the Analysis button will open the EDS view. EDS supports qualitative/quantitative analysis, point analysis, and mapping (elemental distribution).
NeoScope incorporates a JEOL proprietary dry SD detector. The detector is always ready for analysis during SEM imaging.
Two buttons, Image and Spc, initiate analysis. Pressing the Quantitative button after data acquisition will display quantitative results.
Analytical Assistance is one of the functions to help the operator navigate any data acquisition process, including mapping and line analysis. When a type of analysis is selected from the Analytical Assistance view, the system will display a series of process steps needed for the analysis. The buttons shown in the view will guide the operator through any analytical procedure.
When multiple analytical points are selected on the image, the system will automatically analyze the elements on each point, and display spectral data. These spectra can be compared after the analysis is completed.
When a line is defined on the image, the system will begin measuring relative concentration changes in the elements on the line. The elements may be edited after the analysis is completed.
Probe tracking is designed to maintain a stable analytical point for prolonged operation.
The Tilting and rotating motor drive holder allows the operator to examine samples at different angles. Observation of a tilted sample results in 3 dimensional information of the sample. The tilt rotation motorized specimen holder is optional.
NeoScope will be ready for operation in 3 minutes after it is powered on. Placing a sample and closing the door will automatically initiate the evacuation sequence. An SEM image will be displayed when the evacuation is completed.
A single touch on the panel can switch the mode between High Vacuum and Low Vacuum.
Changing filaments is simple and easy. Unlike the conventional filament assembly that requires cleaning of the wehnelt, the electron gun in NeoScope uses a pre-centered cartridge filament that integrates a wehnelt. Since the cartridge is replaced as a unit, cleaning of the wehnelt or centering of the filament is not needed. The exchange process is quick and insures correct positioning of the filament.
Any new filament that is installed requires alignment to ensure good image quality. The alignment process is fully automated with NeoScope.